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Oops, I did it again : An ERP exploration of error-monitoring processes in depression

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dc.contributor.advisor Compton, Rebecca en_US
dc.contributor.advisor Sternberg, Wendy Lin, Min en_US 2007-02-28T20:31:44Z 2007-02-28T20:31:44Z 2006 en_US
dc.description.abstract Several EEG studies have found ERPs that directly reflect error monitoring processes that are thought to occur in the anterior cingulate cortex. Researchers have observed differences in these ERPs in individuals with depression, yet the direction of these patterns have been inconsistent. While some results suggest that depressed individuals have increased responses to mistakes because they are more sensitive to the negative implications of being wrong, other results suggest that they have decreased responses to error due to feelings of helplessness. The present study explored these error-processing differences using selective-attention tasks that involve cognitive and affective processing to tease apart the effects of depression. Our analyses failed to show significant differences in error-related ERPs between depressed and control subjects although they revealed relationships between the ERP components and subsequent behavior, thus providing insight on how cognitive control is executed. We also explored these error-processing mechanisms in terms of affective differences and find that positive affect contributes to cognitive control. Implications of these findings along with suggestions for extensions on the present study are discussed. en_US
dc.description.sponsorship Haverford College. Dept. of Psychology en_US
dc.format.extent 235603 bytes en_US
dc.format.extent 122461 bytes
dc.format.mimetype application/pdf en_US
dc.format.mimetype text/plain
dc.language.iso en_US en_US
dc.subject.lcsh Depression, Mental -- Physiological aspects
dc.subject.lcsh Evoked potentials (Electrophysiology)
dc.subject.lcsh Error -- Psychological aspects
dc.title Oops, I did it again : An ERP exploration of error-monitoring processes in depression en_US
dc.type Thesis (B.A.) en_US

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